A multi-voltage aware resistive open fault model
Resistive open faults (ROFs) represent common interconnect manufacturing defects in VLSI designs {causing delay failures and reliability-related concerns}. The widespread utilization of multiple supply voltages in contemporary VLSI designs and {emerging test methods} poses a critical concern as to w...
Main Authors: | Mohammadat, Mohamed Tagelsir (Author), Zain Ali, Noohul Basheer (Author), Hussin, Fawnizu Azmadi (Author), Zwolinski, Mark (Author) |
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Format: | Article |
Language: | English |
Published: |
2014-02.
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Subjects: | |
Online Access: | Get fulltext |
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