Hot-wire polysilicon waveguides with low deposition temperature
We fabricated and measured the optical loss of polysilicon waveguides deposited using Hot-Wire Chemical Vapour Deposition (HWCVD) at a temperature of 240°C. A polysilicon film 220 nm thick was deposited on top of a 2000 nm thick PECVD silicon dioxide. The crystalline volume fraction of the polysilic...
Main Authors: | Ben Masaud, Taha (Author), Tarazona, Antulio (Author), Jaberansary, Ehsan (Author), Chen, Xia (Author), Reed, Graham T. (Author), Mashanovich, Goran Z. (Author), Chong, Harold M.H (Author) |
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Format: | Article |
Language: | English |
Published: |
2013.
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Subjects: | |
Online Access: | Get fulltext |
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