Simultaneous switching noise: the relation between bus layout and coding
As device geometries shrink and power supply voltages decrease, simultaneous switching noise (SSN) is having a detrimental effect on IC reliability. This article analyzes the impact of different bus transitions on SSN. Transitions involving the same number of switching signals, but with different pl...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2008-01.
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| Subjects: | |
| Online Access: | Get fulltext |