DFT architecture with power-distribution-network consideration for delay-based power gating test
This paper shows that existing delay-based testing techniques for power gating exhibit both fault coverage and yield loss due to deviations at the charging delay introduced by the distributed nature of the power-distribution-networks (PDNs). To restore this test quality loss, which could reach up to...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
2015-06-18.
|
| Subjects: | |
| Online Access: | Get fulltext |