High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals
A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO<sub>4</sub> and LNbO<sub>3</sub>. Striations have been revealed in high strain-sensitivity multiple-crystal topo...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
1995-04-14.
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| Subjects: | |
| Online Access: | Get fulltext |