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Institution of Electrical Engineers (IEE),
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Faqir, Mustapha
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Search Results - Institution of Electrical Engineers (IEE),
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Institution of Electrical Engineers (IEE),
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Evidence for impact ionisation in AlGaN/GaN HEMTs with InGaN back-barrier
by
Palacios, Tomas
,
Killat, Nicole
,
Tapajna, Milan
,
Faqir, Mustapha
,
Kuball, Martin
Published 2012
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Institution
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Electrical
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IEE
),...
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Faqir, Mustapha
Killat, Nicole
1
Kuball, Martin
1
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
1
Palacios, Tomas
1
Tapajna, Milan
1
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