Random telegraph noise 2 Telegraph Bias temperature instability 1 Bias-temperature instability 1 Charge trapping 1 Charge-trapping 1 Compact model 1 Compact modeling 1 Cryogenic modeling 1 Cryogenics 1 Device fluctuation 1 Fluctuations 1 Gate-leakage current 1 Gate-leakage currents 1 Hysteresis 1 Jitters 1 Leakage currents 1 Low power electronics 1 MOS devices 1 Multiphonons 1 Negative bias temperature instability 1 Negative-bias temperature instability (NBTI) 1 Non-radiative 1 Nonradiative multiphonon theory 1 Positive charges 1 Random telegraph noise (RTN) 1 Threshold voltage 1 Trap assisted tunneling 1 Trap-assisted-tunneling 1 Within-a-device-fluctuation 1