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Keizer, A.
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Keizer, A.
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Keizer, A.
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1
Nanoscale multiply charged focused ion beam platform for surface modification, implantation, and analysis
by
Been, T.
,
Birou, T.
,
Bourin, C.
,
Cassimi, A.
,
Delobbe, A.
,
Guillous, S.
,
Houel, A.
,
Keizer
,
A
.
,
Lalande, M.
,
Mellier, J.-B
,
Ramillon, J.-M
,
Salou, P.
,
Sineau, A.
Published 2022
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Article
2
iGovernment
by
Prins, C.
Published 2011
Other Authors:
“
...
Keizer
,
A
.-G...
”
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Related Subjects
Atomic force
Beam-columns
Cyclotrons
Electron cyclotron resonance
Focused ion beams
Focused ions beams
Image enhancement
Image resolution
Ion implantation
Ion sources
Ions implantation
Multiply charged
Nano scale
Nanometric scale
Performance
Politics & government
Secondary electrons
Surface-modification
Vacuum applications
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