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Peyush Pande
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Peyush Pande
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Peyush Pande
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1
Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an Integrated-Charge Method
by
Mayank Chaturvedi
,
Sima Dimitrijev
,
Hamid Amini Moghadam
,
Daniel Haasmann
,
Peyush
Pande
,
Utkarsh Jadli
Published 2021-01-01
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Article
2
Direct Measurement of Active Near-Interface Traps in the Strong-Accumulation Region of 4H-SiC MOS Capacitors
by
Peyush
Pande
,
Sima Dimitrijev
,
Daniel Haasmann
,
Hamid Amini Moghadam
,
Philip Tanner
,
Jisheng Han
Published 2018-01-01
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Article
3
Modeling Power GaN-HEMTs Using Standard MOSFET Equations and Parameters in SPICE
by
Utkarsh Jadli
,
Faisal Mohd-Yasin
,
Hamid Amini Moghadam
,
Peyush
Pande
,
Mayank Chaturvedi
,
Sima Dimitrijev
Published 2021-01-01
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Article
4
A Method for Selection of Power MOSFETs to Minimize Power Dissipation
by
Utkarsh Jadli
,
Faisal Mohd-Yasin
,
Hamid Amini Moghadam
,
Peyush
Pande
,
Mayank Chaturvedi
,
Sima Dimitrijev
Published 2021-09-01
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Article
5
Measurement of Power Dissipation Due to Parasitic Capacitances of Power MOSFETs
by
Utkarsh Jadli
,
Faisal Mohd-Yasin
,
Hamid Amini Moghadam
,
Peyush
Pande
,
Jordan R. Nicholls
,
Sima Dimitrijev
Published 2020-01-01
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Article
6
The Correct Equation for the Current Through Voltage-Dependent Capacitors
by
Utkarsh Jadli
,
Faisal Mohd-Yasin
,
Hamid Amini Moghadam
,
Jordan R. Nicholls
,
Peyush
Pande
,
Sima Dimitrijev
Published 2020-01-01
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Article
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