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Taleana Huff
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Taleana Huff
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Taleana Huff
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1
Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy
by
Jeremiah Croshaw
,
Thomas Dienel
,
Taleana
Huff
,
Robert Wolkow
Published 2020-09-01
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Article
2
Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
by
Hatem Labidi
,
Mohammad Koleini
,
Taleana
Huff
,
Mark Salomons
,
Martin Cloutier
,
Jason Pitters
,
Robert A. Wolkow
Published 2017-02-01
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Article
3
Lithography for robust and editable atomic-scale silicon devices and memories
by
Roshan Achal
,
Mohammad Rashidi
,
Jeremiah Croshaw
,
David Churchill
,
Marco Taucer
,
Taleana
Huff
,
Martin Cloutier
,
Jason Pitters
,
Robert A. Wolkow
Published 2018-07-01
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