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Thomas Dienel
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Thomas Dienel
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1
Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy
by
Jeremiah Croshaw
,
Thomas
Dienel
,
Taleana Huff
,
Robert Wolkow
Published 2020-09-01
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Article
2
Combinatorial design of molecular seeds for chirality-controlled synthesis of single-walled carbon nanotubes
by
Joerg Tomada
,
Thomas
Dienel
,
Frank Hampel
,
Roman Fasel
,
Konstantin Amsharov
Published 2019-07-01
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