Study on Chip Reliability Modeling Based on Mutually Dependent Competing Failure of Solder Joints in Different Failure Modes
The chip is a core functional component. Its reliability plays a vital role in electronic equipment normal operation. As the typical cause for chip malfunction, the solder joint degradation is selected to study chip reliability. The degradation models of solder joint in different failure modes are e...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9256272/ |