Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM
This paper presents a novel fault diagnosis method for analog circuits using ensemble empirical mode decomposition (EEMD), relative entropy, and extreme learning machine (ELM). First, nominal and faulty response waveforms of a circuit are measured, respectively, and then are decomposed into intrinsi...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2016-01-01
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| Series: | Computational Intelligence and Neuroscience |
| Online Access: | http://dx.doi.org/10.1155/2016/7657054 |