Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output res...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2014-01-01
|
| Series: | Computational Intelligence and Neuroscience |
| Online Access: | http://dx.doi.org/10.1155/2014/740838 |