Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output res...
Main Authors: | Jingyu Zhou, Shulin Tian, Chenglin Yang, Xuelong Ren |
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Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2014-01-01
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Series: | Computational Intelligence and Neuroscience |
Online Access: | http://dx.doi.org/10.1155/2014/740838 |
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