Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization

This review paper is devoted to optics of inhomogeneous thin films exhibiting defects consisting in transition layers, overlayers, thickness nonuniformity, boundary roughness and uniaxial anisotropy. The theoretical approaches enabling the inclusion of these defects into formulae expressing the opti...

Full description

Bibliographic Details
Main Authors: Ivan Ohlídal, Jiří Vohánka, Martin Čermák
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Coatings
Subjects:
Online Access:https://www.mdpi.com/2079-6412/11/1/22