Annealing of Boron-Doped Hydrogenated Crystalline Silicon Grown at Low Temperature by PECVD

We investigate low-temperature (<200 °C) plasma-enhanced chemical vapor deposition (PECVD) for the formation of p−n junctions. Compared to the standard diffusion or implantation processes, silicon growth at low temperature by PECVD ensures a lower thermal budget and a bette...

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Bibliographic Details
Main Authors: Marta Chrostowski, José Alvarez, Alessia Le Donne, Simona Binetti, Pere Roca i Cabarrocas
Format: Article
Language:English
Published: MDPI AG 2019-11-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/12/22/3795