Performance analysis of ultra-scaled InAs HEMTs

The scaling behavior of ultra-scaled InAs HEMTs is investigated using a 2-dimensional real-space effective mass ballistic quantum transport simulator. The simulation methodology is first benchmarked against experimental Id-Vgs data obtained from devices with gate lengths ranging from 30 to 50 nm, wh...

Full description

Bibliographic Details
Main Authors: del Alamo, Jesus A. (Contributor), Kim, Dae-Hyun (Contributor), Kharche, Neerav (Author), Luisier, Mathieu (Author)
Other Authors: Massachusetts Institute of Technology. Microsystems Technology Laboratories (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers, 2010-10-21T19:39:42Z.
Subjects:
Online Access:Get fulltext