Advanced Gate Technologies for State-of-the-art f[subscript T] in AlGaN/GaN HEMTs

In this paper, the lower-than-expected frequency performance observed in many AlGaN/GaN high electron mobility transistors (HEMTs) has been attributed to a significant drop of the intrinsic small-signal transconductance (g[subscript m]) with respect to the intrinsic DC g[subscript m]. To reduce this...

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Bibliographic Details
Main Authors: Chung, Jinwook (Contributor), Kim, Tae-Woo (Contributor), Palacios, Tomas (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Microsystems Technology Laboratories (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2012-09-12T19:20:41Z.
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