A self-diagnostic BIST memory design
碩士 === 國立交通大學 === 電子研究所 === 81 === In this thesis, a self-diagnostic BIST RAM structure for the embedded RAM which achieves the self-diagnostic capability with only a minimal overhead is proposed. The BIST structure degrades a little...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1993
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| Online Access: | http://ndltd.ncl.edu.tw/handle/12306003479185957293 |