Simplifying Sequential Circuit Testing
博士 === 國立交通大學 === 電子研究所 === 83 === This dissertation is a result of studies on simplifying sequential circuit testing for digital systems. A simple yet low overhead design for testability scheme is proposed to simplify the sequential test generation. A bu...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/42735016996997984173 |