Modifying User-Defined Logic for Testing Embedded Core

碩士 === 國立中興大學 === 資訊科學學系 === 86 === The increase in integration capacity as well as new packaging techniques creates new possibilities. Multi-chip modules have been in use for some times, and single- chip systems for some simpl...

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Bibliographic Details
Main Authors: Wang, Hung-ju, 王弘儒
Other Authors: Sying-Jyan Wang
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/30401128324623999517