Built-In-Self-Test for Embedded memories
碩士 === 國立中興大學 === 資訊科學研究所 === 87 === Recently, integration of system into a chip becomes very popular. In testing of highly integrated chip, one difficult problem is embedded memory testing. It is hard to test embedded memory because direct controllability and observability are extremely...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/31600621186037796464 |