I. STUDY ON POLYSILICON-PLASMA II.QUANTIFICATION ISSUES OF VAPOR PHASE DECOMPOSITION/TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS

博士 === 國立交通大學 === 電子工程系 === 87 === This dissertation studies the polysilicon thin film-its plasma effects and a high breakdown voltage of Schottky diode made with polysilicon as the guard ring, and the quantification issues of vapor phase decomposition/total X-ray reflection fluorescence (VPD/TXRF)...

Full description

Bibliographic Details
Main Authors: Bor-Wen Liou, 劉博文
Other Authors: Chung-Len Lee
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/29683153682467942590