Oscillation Ring Test for Digital Sequential Circuits
碩士 === 國立交通大學 === 電子工程系 === 89 === In this thesis, we propose a novel method for testing using theory of oscillation ring testing. The oscillation ring detects stuck-at fault of the sequential circuit, in addition, it detects the delay fault. We propose two methods for generating the test...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/81276650099454760745 |