On the Design and Implementation of Embedded Memory Testing and Built-In Self-Test Schemes
博士 === 國立成功大學 === 電機工程學系 === 90 === In this dissertation, we present several built-in self-test (BIST) schemes for testing the embedded memory and logic cores in the system-on-a-chip (SOC) designs. Due to the memory cells can be tested in a regular address order, the march algorithms are...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37256019188314282562 |