A New BIST Scheme for Digital-to-Analog Converters
碩士 === 國立交通大學 === 電子工程系 === 90 === Testing analog/mixed-signal circuitry becomes more and more difficult due to the rapid advance of the VLSI technology. In this thesis, we propose a new BIST scheme for testing Digital-to-Analog Converters (DACs) by adopting an analog summer to transform...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/82680643567497854452 |