Hot Carrier Reliability of n-channel Lateral Diffused Metal Oxide Semiconductor Field Effect Transistor (LDMOS)
碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 92 === The hot carrier reliability of conventional MOSFETs is established completely by other authors. However, fewer authors study the hot carrier reliability of LDMOS transistors. The thesis will study the hot carrier reliability of n-channel LDMOS transistors....
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/15400191864870100431 |