Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture
碩士 === 中興大學 === 資訊科學系所 === 95 === Launch-off-Shift (LOS) is a widely used technique for delay test in scan-based design. Test data compression for LOS patterns, however, is less efficient. In this paper, we analyze the reason for low compression rate in LOS patterns, and present an LOS test enable...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/68222248359088505127 |