High-Performance Component Design for SOC Test Platforms with Mixed-Signal Test Capability
碩士 === 國立成功大學 === 電機工程學系碩博士班 === 95 === With the development of process of semi-conductor, more and more functionalities will be provided in a single chip. However, the SOC-based design methodology also introduces many new challenges. In order to test an SOC, the ATE-based testing methodology requ...
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| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/32379442278953153186 |