Testing open defects for subthreshold SRAM designs

碩士 === 國立交通大學 === 電子研究所 === 99 === Due to the increasing demand of an extra-low-power system, a great amount of research effort has been spent in the past to develop an effective and economic subthreshold-SRAM design. However, the test methods regarding those newly developed subthreshold-SRAM design...

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Bibliographic Details
Main Authors: Chen, Hung-Hsin, 陳弘昕
Other Authors: Chao, Chia-Tso
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/28239516610888317840