Efficient On-Chip Test Generation Scheme Based on Multiple Twisted-Ring Counters
碩士 === 國立成功大學 === 電機工程學系碩博士班 === 100 === Twisted-ring-counters (TRCs) have been used as built-in test pattern generators for high-performance circuits due to their small area overhead, low performance impact and simple control. However previous work based on a single TRC often requires long test tim...
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| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96966181562537849487 |