Testing Strategies for Retention Flip-flops

碩士 === 國立交通大學 === 電子研究所 === 101 === This thesis presents several issues about testing for retention flip-flops and proposes the corresponding solutions to those issues. A novel test procedure is proposed for detect many defects of retention flip-flops. Furthermore, a specialized ATPG framework is pr...

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Bibliographic Details
Main Authors: Hsu, Hao-Wen, 徐浩文
Other Authors: Chao, Chia-Tso
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/75314384653527203107