A Low Area Overhead BIST Architecture Based on Response Feedback and Logic Reseeding
碩士 === 國立成功大學 === 電機工程學系 === 102 === The built-in self-test (BIST) scheme which adopts circular self-test path (CSTP) is an attractive technique for testing integrated circuits. It can compact output response of the circuit under test (CUT) and generate a new pattern concurrently. As a result, it...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/6z9jw6 |