Physical-aware and Timing-aware Diagnosis for Systematic Defects and Small Delay Defects in Advanced Technology
博士 === 國立臺灣大學 === 電子工程學研究所 === 102 === Systematic defects and small delay defects (SDD) have become key challenges of yield and reliability due to shrinking geometry and increasing frequency in advanced technology. For yield and reliability improvement, physical failure analysis (PFA) is the most w...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78137273623163995987 |