Hot-Carrier Degradation of N-Type MOSFET under Various Bias Condition
碩士 === 國立成功大學 === 微電子工程研究所 === 105 === In the thesis, we mainly discuss the different stress bias condition and the hot carrier reliability induced by hot holes injection on the N-type conventional metal-oxide-semiconductor transistor. The experiment will enhance the hot holes injection and produce...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2017
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Online Access: | http://ndltd.ncl.edu.tw/handle/zkrtvt |