Hot-Carrier Degradation of N-Type MOSFET under Various Bias Condition
碩士 === 國立成功大學 === 微電子工程研究所 === 105 === In the thesis, we mainly discuss the different stress bias condition and the hot carrier reliability induced by hot holes injection on the N-type conventional metal-oxide-semiconductor transistor. The experiment will enhance the hot holes injection and produce...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/zkrtvt |