Autonomous Testing for 3D-ICs with IEEE Std. 1687

碩士 === 國立成功大學 === 電機工程學系 === 105 === IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this thesis, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-...

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Bibliographic Details
Main Authors: Jin-CunYe, 葉金村
Other Authors: Kuen-Jong Lee
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/52a5zn