Test Compression with Single-Input Data Spreader and Multiple Test Sessions

碩士 === 國立成功大學 === 電機工程學系 === 106

Bibliographic Details
Main Authors: Chang-WenChen, 陳昶聞
Other Authors: Kuen-Jong Lee
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/ka6k68