Layout-Based Methodology of Dual-Cell-Aware Tests
碩士 === 國立交通大學 === 電子研究所 === 106 === This thesis proposed a new DCA fault model generate flow to improve the performance of our previous work. We achieve this by changing our method to extract defect in a dual-cell. In this work we do not need to run RC-extraction for every dual-cell pair through the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/8tc6s7 |