Effects of Different Processes on the Characteristics and Reliability of FinFET

碩士 === 國立成功大學 === 微電子工程研究所 === 107

Bibliographic Details
Main Authors: Chun-TingChen, 陳俊庭
Other Authors: Jone-Fang Chen
Format: Others
Language:en_US
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/66d4z4