Test Methodology of Defect-based Bridge Fault

碩士 === 國立交通大學 === 電子研究所 === 107 === This thesis introduces a framework to generate test patterns for defect-based bridge faults. A defect-based bridge fault is extracted by SPICE-simulating a targeted interconnect short defect with the associated paired cells and the corresponding RC networks of bot...

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Bibliographic Details
Main Authors: Hu, Yu-Pang, 胡鈺邦
Other Authors: Chao, Chia-Tso
Format: Others
Language:en_US
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/8gd7mn