Using ordered partial decision diagrams for manufacture test generation
Because of limited tester time and memory, a primary goal of digital circuit manufacture test generation is to create compact test sets. Test generation programs that use Ordered Binary Decision Diagrams (OBDDs) as their primary functional representation excel at this task. Unfortunately, the use o...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2004
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| Online Access: | http://hdl.handle.net/1969.1/498 |